Palo Gallery presents American Glitch, a new exhibition by artist duo Orejarena & Stein (b. 1994, Colombia and United Kingdom), and the photographers’ debut solo exhibition in New York City. Presenting a series of new and recent photographs, American Glitch examines the slip between fact and fiction and its manifestation in the physical landscape of the United States, the duo’s adopted home. Orejarena & Stein lead us to examine that amidst an overwhelming sea of unending information available in an instant, society is left asking what is real and what's fake. What can the world trust, and what is a ‘glitch’?
The exhibition will be on view February 9 through April 6, 2024.
